The Xradia 520 Versa 3D x-ray microscope from Carl Zeiss Microscopy, Thornwood, NY, was designed for non-destructive in situ 3D imaging of hard-to-image materials and their microstructures. The Dual-Scan Contrast Visualizer (DSCoVer) offers compositional contrast with side-by-side tuning of two distinct tomographies, enabling compositional probing for features often indistinguishable in a single scan. The high-aspect ratio tomography (HART) imaging mode delivers tomography acquisition up to 50% faster for flat sample geometries. An automated change filter enables select or application-specific filters to be changed within recipes without manual intervention for greater ease of use and workflow efficiencies. The microscope is also available with an optional in situ interface kit. The Versa platform enables the widest use of in situ rigs in the industry, from high-pressure flow cells to tension, compression, and thermal stages. For more information, visit Carl Zeiss Microscopy.