Zeiss, Oberkochen, Germany, presents a new generation of focused ion beam scanning electron microscopes (FIB-SEMs) with the Zeiss Crossbeam 550, which features an increase in resolution for imaging and material characterization and a speed gain in sample preparation. Nanostructures in biomaterials, composites, metals, or semiconductors, can be investigated with analytical and imaging methods in parallel. The device allows simultaneous modification and monitoring of samples, resulting in fast sample preparation and high throughput. A new tandem decel mode enables enhanced resolution together with maximized image contrast at low landing energies. For more information, visit Zeiss.