The Zeiss FPX flat panel extension for the Zeiss Xradia Versa 500-series of 3D x-ray microscopes from Carl Zeiss Microscopy, Jena, Germany, enables large-sample, high-throughput scanning. Combined with the high resolution of Zeiss Xradia Versa x-ray microscopes (XRM), the extension enhances imaging flexibility and creates workflow efficiencies. Users can examine large samples 2–5x faster to identify a region of interest, and then zoom to image areas at high resolution with the Zeiss Xradia Versa RaaD dual magnification microscope objectives that enable resolution at a distance. The extension permits the microscope to achieve full field of view, whole-sample imaging, up to 5 inches in diameter for samples 10x greater in volume with higher throughput. For more information, visit Carl Zeiss Microscopy.