New generation of ZEISS EVOZeiss, Oberkochen, Germany, has presented the new generation of its scanning electron microscopes (SEMs). The new instruments of the company’s Evo family come with a variety of improvements in usability, image quality, and integration into multimodal workflows. Zeiss Evo offers various vacuum modes—including high vacuum, variable pressure, and high pressure—as well as different detector technologies. An optional lanthanum hexaboride (LaB6) emitter delivers more beam brightness for enhanced image resolution and noise reduction. Zeiss SmartSEM Touch is the highly simplified user interface developed specifically for the occasional operator who has very limited or no knowledge of operating an SEM. Zeiss Evo can be configured to be part of a semiautomated multimodal workflow, with tools for seamless relocation of regions of interest, and integrity of data collected from multiple modalities. In such configurations, Zeiss Evo enables highly productive correlative microscopy and analysis methods to provide users with more meaningful data and a deeper understanding of their samples.